特点
- 0.1%基本精确度
- 测试频率最高可达1MHz
- 最高测试速度可达每秒30个项目
- 提供治具短路 / 开路校正功能
- 提供完整的测试功能, 一次完成
- 提供Meter模式, 可精确测量
- 内建8mA DC Bias Option
- 最高可达80个测试点数
- 直觉式人性化操作接口
- RS-232, GPIB接口与计算机联机
技术规格
|
系统规格表 |
|
Model |
5235 |
5236 |
5237 |
|
Frequency |
200K |
500K |
1M |
|
Test Parameter |
|
|
Transformer Scanning |
Turn Ratio, Phase, L, Q, Leakage L, Balance, ACR, Cp, D, X, Y, DCR, Pin Short |
|
Test Signals Information |
|
|
Test Frequency (0.01%, 5digits) |
Turn |
1kHz~200kHz |
1kHz~500kHz |
1kHz~1MHz |
|
Others |
20Hz~200kHz |
20Hz~500kHz |
20Hz~1MHz |
|
Output Impedance |
100Ω |
|
MeasurementRange |
|
|
L, LK |
0.00001uH~9999.99H |
|
C |
1pF~999.99mF |
|
Q, D |
0.00001~99999 |
|
Z, X, R |
0.00001Ω~99.9999MΩ |
|
Y |
0.01nS~99.9999S |
|
θ |
-90.00o~+90.00o |
|
DCR |
0.01mΩ~99.999MΩ |
|
Turn |
0.01~99999.99turns |
|
Pin-Short |
12 pairs, between pin to pin |
|
Basic Accuracy |
|
|
L, LK, C, Z, X, Y, R, DCR |
0.1% (1kHz if AC parameter) |
|
Q, D |
0.0005 (1kHz) |
|
θ |
0.03o (1kHz) |
|
Turn |
0.5% (1kHz) |
|
Measurement Speed (Fastest) |
|
|
L, LK, C, Z, X, Y, R, DCR |
75ms |
|
DCR |
30m/s |
|
Turn |
75ms |
|
Judge |
|
|
Transformer Scanning |
PASS/FAIL judge of all test parameters output from optional HANDLER interface |
|
Test Channel |
80 Channels |
|
Trigger |
Internal, Manual, External |
|
Display |
320*240 dot-matrix LCD display |
|
Equivalent Circuit Mode |
Series, Parallel |
|
Correction Function |
Open/Short Zeroing, Load deviatiom |
|
Memory |
60 instrument setups |
|
General |
|
|
Operation Environment |
Temperature :10oC ~ 40oC, Humidity :10%~90% RH |
|
Power Consumption |
140VA max. |
|
Power Requirement |
90Vac~125Vac or 190Vac~250Vac, 48Hz~62Hz |
|
Weight |
Approx. 9kg |
|
Dimension (W*H*D) |
480*180*320mm | |
|